Graphene and Related Materials Characterisation - Online Consultation Survey

This consultation is being undertaken as part of VAMAS TWA 41.


The exercise aims to assess the global needs on measurement parameters, methods and applications for graphene and related materials; This is with a view to unify the relevant parameters, measurement standards, inspection and detection methods and for the development of scientific research and production of the materials for the future.

 

There are two parts of this questionnaire: 

A. Samples,

B. Parameters / Measurement techniques / Measuring instruments.


Note that since graphene and related materials possess diversified properties and extensive applications, if participant has interested information not be included in the survey, please list them in ‘other’ option.


Important Announcement: all participants are volunteered, and must guarantee the information obtained from this survey for proper use only.
PART A: Samples

Please choose the level of TECHNICAL DIFFICULTY for material properties characterization, using the three levels
1.Properties with HIGHEST difficulties to be determined with current feasible techniques;
2.Properties with MODERATE difficulties to be determined with current feasible techniques;
3.Properties withLOWEST difficulties to be determined with current feasible techniques.

In addition, please identify the desired timescales for accurate measurement of each of the properties characterization
within 1 year
within 2 years
within 3 years
1.
A.1 POWDER [Multiple]
TECHNICAL DIFFICULTY LOWTECHNICAL DIFFICULTY MEDIUMTECHNICAL DIFFICULTY HIGHURGENCY NEED Within 1 YEARURGENCY NEED Within 2 YEARSURGENCY NEED Within 3 YEARS
1. Physical Properties
Appearance / Morphology / Aspect Ratio
Size and its Distribution
Surface Area / Specific Surface Area
Water Content / Solid Content
pH Value
Layer Number
Monolayer Content
Structure
2. Chemical Properties
Composition
Dispersity
Concentration
Zeta Potential
Elements (C\H\O\N\S)
Ion Content (Cl-, SO42-)
Purity (Metal)
3. Characteristics
Electrical Conductivity
Thermal Conductivity
Bulk Density(Tap Density)
2.
For powder materials, please use the space below to provide information on any other additional detauils not already covered.
3.
A.2 SLURRY [Multiple]
TECHNICAL DIFFICULTY LOWTECHNICAL DIFFICULTY MEDIUMTECHNICAL DIFFICULTY HIGHURGENCY NEED Within 1 YEARURGENCY NEED Within 2 YEARSURGENCY NEED Within 3 YEARS
1. Physical Properties
Appearance / Morphology
pH Value
Particle Size and Distribution
Layer Number
Graphene Content / Total Solid Content
Monolayer Content
Dispersity
2. Chemical Properties
Ion Content (Cl-, SO42-)
Purity (Metal)
Structure
3. Characteristics
Electrical Conductivity
Thermal Conductivity
Flowability
4.
For slurry materials, please use the space below to provide information on any other additional detauils not already covered.
5.
A.3 FILM [Multiple]
TECHNICAL DIFFICULTY LOWTECHNICAL DIFFICULTY MEDIUMTECHNICAL DIFFICULTY HIGHURGENCY NEED Within 1 YEARURGENCY NEED Within 2 YEARSURGENCY NEED Within 3 YEARS
1. Physical Properties
Layer Number
Defect Distribution / Defect Density
Thickness
2. Chemical Properties
Composition(C/O ratio)
Amorphous State
Crystal Structure
Dopant
3. Characteristics
Roughness
Elastic Modulus
Stress / Strain
Surface Resistance / Square Resistance
Hall Effect
Electron Mobility
Electrical Conductivity
Thermal Conductivity
Transmittance
Index of Refraction
6.
For film materials, please use the space below to provide information on any other additional detauils not already covered.
7.
A.4 CUSTOM PRODUCT [Multiple]
TECHNICAL DIFFICULTY LOWTECHNICAL DIFFICULTY MEDIUMTECHNICAL DIFFICULTY HIGHURGENCY NEED Within 1 YEARURGENCY NEED Within 2 YEARSURGENCY NEED Within 3 YEARS
1. Physical Properties
Wear Resistance
Corrosion Prevention
Lubrication
Heat Retention
Energy Storage
Adsorption
2. Functional Tests
Far Infrared Absorption / Radiation
Salt Spray Test
Anti-ultraviolet Test / Ultraviolet Degration
Abrasion Test
Adhesive Ability
Shielding Capability
Charge Rate / Discharge Rate
Electrical Conductivity
Temperature Rise
8.
For custom products, please use the space below to provide information on any other additional detauils not already covered.
Part B: Parameters / Measurement techniques / Measuring instruments.

Please select one or more following material(s), 1. Powder, 2. Slurry, 3. Film or 4. Custom product, to corresponding measuring instruments to be used. In addition, please mark the usage time of the equipment between two options, 1. ≦ 100 hours/month and 2. > 200 hours/month.
9.
Part B.  [Multiple]
POWDERSLURRYFILMCUSTOM PRODUCTUSAGE TIME ≦ 100 hr/moUSAGE TIME > 200 hr/mo
1. Electron Microscope
1.1 Scanning Electron Microscope
1.2 Transmission Electron Microscope
1.3 Field Emission Microscope
POWDERSLURRYFILMCUSTOM PRODUCTUSAGE TIME ≦ 100 hr/moUSAGE TIME > 200 hr/mo
2. Near-field Probe Microscope
2.1 Scanning Probe Microscope
2.2 Atomic Force Microscope
2.3 Scanning Near Field Optical Microscope
POWDERSLURRYFILMCUSTOM PRODUCTUSAGE TIME ≦ 100 hr/moUSAGE TIME > 200 hr/mo
3. Light Scattering Spectrum
3.1 Light Diffraction
3.2 Dynamic Light Scattering / Photon Correlation Spectroscopy
3.3 Small Angle X-Ray Scattering
3.4 X-Ray Diffractometer
3.5 Laser Particle Size Analyzer
POWDERSLURRYFILMCUSTOM PRODUCTUSAGE TIME ≦ 100 hr/moUSAGE TIME > 200 hr/mo
4. Materials Analysis
4.1 Auger Electron Spectroscopy
4.2 Raman Spectroscopy
4.3 Electron Spectroscopy for Chemical Analysis (ESCA)
4.4 Inductively Coupled Plasma Mass Spectrometry
4.5 Fourier Transform Infrared Spectroscopy
4.6 UV-VIS-NIR Spectrum
POWDERSLURRYFILMCUSTOM PRODUCTUSAGE TIME ≦ 100 hr/moUSAGE TIME > 200 hr/mo
5. Functional Test
5.1 Laser Thermal Power Analyzer
5.2 Hall Effect System
5.3 Electrochemical Test
5.4 Nano-Indentation
5.5 Fineness of Grind Gage
10.
For Part B, please use the space below to provide information on any other additional details not already covered.
*11.
Participant Information:
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Organization:  *
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Email: *
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