| POWDER | SLURRY | FILM | CUSTOM PRODUCT | USAGE TIME ≦ 100 hr/mo | USAGE TIME > 200 hr/mo |
---|
1. Electron Microscope |
1.1 Scanning Electron Microscope |
1.1 Scanning Electron Microscope | | | | | | |
1.2 Transmission Electron Microscope |
1.2 Transmission Electron Microscope | | | | | | |
1.3 Field Emission Microscope |
1.3 Field Emission Microscope | | | | | | |
|
| POWDER | SLURRY | FILM | CUSTOM PRODUCT | USAGE TIME ≦ 100 hr/mo | USAGE TIME > 200 hr/mo |
---|
2. Near-field Probe Microscope |
2.1 Scanning Probe Microscope |
2.1 Scanning Probe Microscope | | | | | | |
2.2 Atomic Force Microscope |
2.2 Atomic Force Microscope | | | | | | |
2.3 Scanning Near Field Optical Microscope |
2.3 Scanning Near Field Optical Microscope | | | | | | |
|
| POWDER | SLURRY | FILM | CUSTOM PRODUCT | USAGE TIME ≦ 100 hr/mo | USAGE TIME > 200 hr/mo |
---|
3. Light Scattering Spectrum |
3.1 Light Diffraction |
3.1 Light Diffraction | | | | | | |
3.2 Dynamic Light Scattering / Photon Correlation Spectroscopy |
3.2 Dynamic Light Scattering / Photon Correlation Spectroscopy | | | | | | |
3.3 Small Angle X-Ray Scattering |
3.3 Small Angle X-Ray Scattering | | | | | | |
3.4 X-Ray Diffractometer |
3.4 X-Ray Diffractometer | | | | | | |
3.5 Laser Particle Size Analyzer |
3.5 Laser Particle Size Analyzer | | | | | | |
|
| POWDER | SLURRY | FILM | CUSTOM PRODUCT | USAGE TIME ≦ 100 hr/mo | USAGE TIME > 200 hr/mo |
---|
4. Materials Analysis |
4.1 Auger Electron Spectroscopy |
4.1 Auger Electron Spectroscopy | | | | | | |
4.2 Raman Spectroscopy |
4.2 Raman Spectroscopy | | | | | | |
4.3 Electron Spectroscopy for Chemical Analysis (ESCA) |
4.3 Electron Spectroscopy for Chemical Analysis (ESCA) | | | | | | |
4.4 Inductively Coupled Plasma Mass Spectrometry |
4.4 Inductively Coupled Plasma Mass Spectrometry | | | | | | |
4.5 Fourier Transform Infrared Spectroscopy |
4.5 Fourier Transform Infrared Spectroscopy | | | | | | |
4.6 UV-VIS-NIR Spectrum |
4.6 UV-VIS-NIR Spectrum | | | | | | |
|
| POWDER | SLURRY | FILM | CUSTOM PRODUCT | USAGE TIME ≦ 100 hr/mo | USAGE TIME > 200 hr/mo |
---|
5. Functional Test |
5.1 Laser Thermal Power Analyzer |
5.1 Laser Thermal Power Analyzer | | | | | | |
5.2 Hall Effect System |
5.2 Hall Effect System | | | | | | |
5.3 Electrochemical Test |
5.3 Electrochemical Test | | | | | | |
5.4 Nano-Indentation |
5.4 Nano-Indentation | | | | | | |
5.5 Fineness of Grind Gage |
5.5 Fineness of Grind Gage | | | | | | |